XIS-6545DV
The XIS-6545DV is a dual-view system that provides operators with two viewing angles, allowing real-time assessment of complex bags and parcels
PRODUCT HIGHLIGHTS
- dual-view imaging system for comprehensive and precise evaluation of items;
- high-resolution imaging for clear and detailed visualization;
- advanced material discrimination for accurate threat identification
- real-time diagnostics for rapid decision-making;
- high-contrast image analysis for optimal threat detection;
- advanced Artificial Intelligence (AI) features for intelligent threat detection (optional).
PRODUCT INFORMATION
The XIS-6545DV is an advanced X-ray inspection system designed for dual-view screening. With its powerful generators, it provides two viewing angles of inspected items. Each view can be analyzed independently, allowing operators to perform fast and detailed inspections while simultaneously using multiple screening modes.
Equipped with Astrophysics’ advanced imaging software, the XIS-6545DV enables operators to analyze items using high-contrast color filters, quickly identifying materials, recognizing objects, and isolating threats with greater speed and accuracy.